ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,251, issued on June 23, was assigned to MITUTOYO Corp. (Kawasaki, Japan). "Small-sized measuring device and operating method of the same" w... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,252, issued on June 23, was assigned to Asahi Kasei Microdevices Corp. (Tokyo). "Estimation apparatus, apparatus, estimation method and com... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,253, issued on June 23, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Alignment direction detection device" was invented by Jin Inoue... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,255, issued on June 23, was assigned to Chapman Unviersity (Orange, Calif.). "Super interferometric range resolution" was invented by John ... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,256, issued on June 23, was assigned to Mitsubishi Electric Research Laboratories Inc. (Cambridge, Mass.). "Systems and methods for multi-s... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,257, issued on June 23, was assigned to TRUMPF LASER SE (Schramberg, Germany). "Method and system for adjusting a reference section of an O... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,258, issued on June 23, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Defect detection device and defect detection method" was invented b... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,259, issued on June 23, was assigned to GlobalWafers Co. Ltd. (Hsinchu, Taiwan). "Full wafer thickness map reflectometry" was invented by B... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,260, issued on June 23, was assigned to HELMERICH & PAYNE TECHNOLOGIES LLC (Tulsa, Okla.). "System and method for locating, measuring, coun... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,261, issued on June 23, was assigned to OTTOBOCK SE & CO KGAA (Duderstadt, Germany). "Method for creating a 3D scan and contact element for... और पढ़ें