ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,251, issued on June 23, was assigned to MITUTOYO Corp. (Kawasaki, Japan). "Small-sized measuring device and operating method of the same" w... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,252, issued on June 23, was assigned to Asahi Kasei Microdevices Corp. (Tokyo). "Estimation apparatus, apparatus, estimation method and com... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,253, issued on June 23, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Alignment direction detection device" was invented by Jin Inoue... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,255, issued on June 23, was assigned to Chapman Unviersity (Orange, Calif.). "Super interferometric range resolution" was invented by John ... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,256, issued on June 23, was assigned to Mitsubishi Electric Research Laboratories Inc. (Cambridge, Mass.). "Systems and methods for multi-s... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,257, issued on June 23, was assigned to TRUMPF LASER SE (Schramberg, Germany). "Method and system for adjusting a reference section of an O... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,258, issued on June 23, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Defect detection device and defect detection method" was invented b... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,259, issued on June 23, was assigned to GlobalWafers Co. Ltd. (Hsinchu, Taiwan). "Full wafer thickness map reflectometry" was invented by B... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,260, issued on June 23, was assigned to HELMERICH & PAYNE TECHNOLOGIES LLC (Tulsa, Okla.). "System and method for locating, measuring, coun... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,261, issued on June 23, was assigned to OTTOBOCK SE & CO KGAA (Duderstadt, Germany). "Method for creating a 3D scan and contact element for... Read More